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Observation of hotspot in BSCCO thin film structure by fluorescent thermal imaging
anis ST-500 可应用于< Observation of hotspot in BSCCO thin film structure by fluorescent thermal imaging >   文章题目:  < Observation of hotspot in BSCCO thin film structure by fluorescent thermal imaging >   发表出处:Physica C   作者单位: Department of Physics, University of Oslo Department of Materials Science and Technology, Nagaoka University of Technology,   如果感兴趣,请联系我公司索取文章及详细应用.